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Optimal lot size and inspection policy for products sold with warranty

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  • Yeh, Ruey Huei
  • Chen, Tzu-Hui

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  • Yeh, Ruey Huei & Chen, Tzu-Hui, 2006. "Optimal lot size and inspection policy for products sold with warranty," European Journal of Operational Research, Elsevier, vol. 174(2), pages 766-776, October.
    • Handle: RePEc:eee:ejores:v:174:y:2006:i:2:p:766-776
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    References listed on IDEAS

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    1. Tapiero, Charles S. & Lee, Hau L., 1989. "Quality control and product servicing: A decision framework," European Journal of Operational Research, Elsevier, vol. 39(3), pages 261-273, April.
    2. Djamaludin, I. & Murthy, D. N. P. & Wilson, R. J., 1994. "Quality control through lot sizing for items sold with warranty," International Journal of Production Economics, Elsevier, vol. 33(1-3), pages 97-107, January.
    3. Murthy, D. N. P. & Blischke, W. R., 1992. "Product warranty management -- II: An integrated framework for study," European Journal of Operational Research, Elsevier, vol. 62(3), pages 261-281, November.
    4. Evan L. Porteus, 1986. "Optimal Lot Sizing, Process Quality Improvement and Setup Cost Reduction," Operations Research, INFORMS, vol. 34(1), pages 137-144, February.
    5. Jinfa Chen & David D. Yao & Shaohui Zheng, 1998. "Quality Control for Products Supplied with Warranty," Operations Research, INFORMS, vol. 46(1), pages 107-115, February.
    6. Murthy, D. N. P. & Blischke, W. R., 1992. "Product warranty management -- III: A review of mathematical models," European Journal of Operational Research, Elsevier, vol. 63(1), pages 1-34, November.
    7. Blischke, W. R. & Murthy, D. N. P., 1992. "Product warranty management -- I: A taxonomy for warranty policies," European Journal of Operational Research, Elsevier, vol. 62(2), pages 127-148, October.
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    Cited by:

    1. Da Wen & Pan Ershun & Wang Ying & Liao Wenzhu, 2016. "An economic production quantity model for a deteriorating system integrated with predictive maintenance strategy," Journal of Intelligent Manufacturing, Springer, vol. 27(6), pages 1323-1333, December.
    2. Shafiee, Mahmood & Chukova, Stefanka, 2013. "Maintenance models in warranty: A literature review," European Journal of Operational Research, Elsevier, vol. 229(3), pages 561-572.
    3. Wang, Chih-Hsiung, 2009. "Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing," European Journal of Operational Research, Elsevier, vol. 197(1), pages 126-133, August.
    4. Yoo, Seung Ho & Kim, DaeSoo & Park, Myung-Sub, 2009. "Economic production quantity model with imperfect-quality items, two-way imperfect inspection and sales return," International Journal of Production Economics, Elsevier, vol. 121(1), pages 255-265, September.
    5. Hu, Fei & Zong, Qun, 2009. "Optimal production run time for a deteriorating production system under an extended inspection policy," European Journal of Operational Research, Elsevier, vol. 196(3), pages 979-986, August.
    6. Yoo, Seung Ho & Kim, DaeSoo & Park, Myung-Sub, 2012. "Lot sizing and quality investment with quality cost analyses for imperfect production and inspection processes with commercial return," International Journal of Production Economics, Elsevier, vol. 140(2), pages 922-933.

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