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Patents, R&D, and Invention Potential: International Evidence

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Author Info
Evenson, Robert E
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Article provided by American Economic Association in its journal American Economic Review.

Volume (Year): 83 (1993)
Issue (Month): 2 (May)
Pages: 463-68
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Handle: RePEc:aea:aecrev:v:83:y:1993:i:2:p:463-68

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  1. Jean Olson Lanjouw & Mark Schankerman, 2002. "Research Productivity and Patent Quality: Measurement with Multiple Indicators," STICERD - Economics of Industry Papers 32, Suntory and Toyota International Centres for Economics and Related Disciplines, LSE. [Downloadable!]
  2. Alexandre Almeida & Aurora A.C. Teixeira, 2007. "Does Patenting negatively impact on R&D investment?An international panel data assessment," FEP Working Papers 255, Universidade do Porto, Faculdade de Economia do Porto. [Downloadable!]
  3. Lanjouw, Jean O & Schankerman, Mark, 2002. "Research Productivity and Patent Quality: Measurement with Multiple Indicators," CEPR Discussion Papers 3623, C.E.P.R. Discussion Papers. [Downloadable!] (restricted)
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This page was last updated on 2009-12-13.

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